标题： 一个扩展的X射线束设施（BEaTriX）用于测试ATHENA光学的模块化元件 显示英文标题

标题： An expanded X-ray beam facility (BEaTriX) to test the modular elements of the ATHENA optics

摘要： 未来的大X射线观测台，如ATHENA，将配备由组装模块化光学元件构成的非常大的光学系统，这些元件被称为X射线光学单元（XOU），基于硅孔光学或弯曲玻璃光学技术。 在两种情况下，模块化光学的最终质量（ATHENA的5角秒HEW要求）由XOU在装配中的对准精度决定，同时也由单个XOU的角分辨率决定。 这受到镜面形状精度、表面粗糙度以及XOU内部镜面相互对准的影响。 由于需要生产大量XOU，需要常规进行质量测试，以选择性能最好的堆叠块，集成到最终的光学系统中。 除了通常基于轮廓和粗糙度测量的计量方法外，使用宽广、平行、准直且均匀的X射线束进行直接测量将是最重要的测试方法，而无需像同步辐射光中通常所做的那样进行焦点斑点重建。 为此，我们设计了BEaTriX（Beam Expander Testing X-ray facility）设施，将在INAF-OAB实现，专门用于XOU的功能测试。 掠入射抛物面镜和一个不对称切割的晶体将产生足够宽的平行X射线束，以照亮聚焦元件的整个孔径。 位于镜片焦距处的X射线相机将直接记录图像。 选择不同的晶体将使我们在1 - 5 keV范围内测试XOU，该范围包含ATHENA的X射线能带（0.2-12 keV）。 在本文中，我们讨论了可能的BEaTriX设施实施方案。 我们还展示了光学系统的初步性能模拟。 显示英文摘要

摘要： Future large X-ray observatories like ATHENA will be equipped with very large optics, obtained by assembling modular optical elements, named X-ray Optical Units (XOU) based on the technology of either Silicon Pore Optics or Slumped Glass Optics. In both cases, the final quality of the modular optic (a 5 arcsec HEW requirement for ATHENA) is determined by the accuracy alignment of the XOUs within the assembly, but also by the angular resolution of the individual XOU. This is affected by the mirror shape accuracy, its surface roughness, and the mutual alignment of the mirrors within the XOU itself. Because of the large number of XOUs to be produced, quality tests need to be routinely done to select the most performing stacked blocks, to be integrated into the final optic. In addition to the usual metrology based on profile and roughness measurements, a direct measurement with a broad, parallel, collimated and uniform X- ray beam would be the most reliable test, without the need of a focal spot reconstruction as usually done in synchrotron light. To this end, we designed the BEaTriX (Beam Expander Testing X-ray facility) to be realized at INAF-OAB, devoted to the functional tests of the XOUs. A grazing incidence parabolic mirror and an asymmetrically cut crystal will produce a parallel X-ray beam broad enough to illuminate the entire aperture of the focusing elements. An X-ray camera at the focal distance from the mirrors will directly record the image. The selection of different crystals will enable to test the XOUs in the 1 - 5 keV range, included in the X-ray energy band of ATHENA (0.2-12 keV). In this paper we discuss a possible BEaTriX facility implementation. We also show a preliminary performance simulation of the optical system.