标题： OpenYield：一个开源的SRAM良率分析和优化基准测试套件 显示英文标题

标题： OpenYield: An Open-Source SRAM Yield Analysis and Optimization Benchmark Suite

摘要： 静态随机存取存储器（SRAM）良率分析对于半导体创新至关重要，但研究进展面临一个关键挑战：简化的学生模型与复杂的工业现实之间存在显著脱节。 缺乏开放的现实基准导致了可重复性危机，其中有前景的学生技术往往无法转化为工业实践。 我们提出了\textit{开放收益率}，一个全面的开源生态系统，旨在通过三个核心贡献来解决这一关键差距：（1）一种现实的SRAM电路生成器，独特地结合了关键的二阶效应寄生参数、单元间漏电耦合和外围电路变化，这些因素通常在学生研究中被忽略，但在工业设计中却至关重要。 （2）一个标准化的评估平台，具有简单的界面和实现的基线良率分析算法，使公平比较和可重复的研究成为可能。 （3）一个标准化的SRAM优化平台，展示了 OpenYield 在提高SRAM设计鲁棒性和效率方面的实用性，为优化算法提供了一个全面的基准。 OpenYield 为有意义的学术界与工业界合作奠定了基础，加速了存储器设计的创新。 该框架可在\href{https://github.com/ShenShan123/OpenYield}{OpenYield：URL}公开获得 显示英文摘要

摘要： Static Random-Access Memory (SRAM) yield analysis is essential for semiconductor innovation, yet research progress faces a critical challenge: the significant disconnect between simplified academic models and complex industrial realities. The absence of open, realistic benchmarks has created a reproducibility crisis, where promising academic techniques often fail to translate to industrial practice. We present \textit{OpenYield}, a comprehensive open-source ecosystem designed to address this critical gap through three core contributions: (1) A realistic SRAM circuit generator that uniquely incorporates critical second-order-effect parasitics, inter-cell leakage coupling, and peripheral circuit variations, which are typically omitted in academic studies but decisive in industrial designs. (2) A standardized evaluation platform with a simple interface and implemented baseline yield analysis algorithms, enabling fair comparisons and reproducible research. (3) A standardized SRAM optimization platform, demonstrating OpenYield's utility in enhancing SRAM design robustness and efficiency, providing a comprehensive benchmark for optimization algorithms. OpenYield creates a foundation for meaningful academia-industry collaboration, accelerating innovation in memory design. The framework is publicly available on \href{https://github.com/ShenShan123/OpenYield}{OpenYield:URL}