标题： 电压成像显微技术中时间采样的影响 显示英文标题

标题： Implications of temporal sampling in voltage imaging microscopy

摘要： 意义：电压成像显微技术已成为研究体内和体外神经活动的强大工具。 已经开发了各种成像方法，包括点扫描、线扫描和宽场显微镜，但它们不同的时间采样方法对信号保真度的影响尚未得到充分研究。 目的：对扫描显微镜和宽场显微镜中时间采样的固有优缺点及其对电压尖峰检测保真度的影响进行分析。 方法：我们基于解析建模和计算机模拟与蒙特卡罗方法相结合的数学框架进行开发。 结果：在低信噪比条件下，以及只需要检测少量尖峰时，扫描显微镜优于宽场显微镜。 当测量时间采样不足且需要检测大量尖峰时，宽场显微镜优于扫描显微镜。 当采样增加且帧率达到电压指示剂的衰减率时，两种模式的性能趋于一致。 结论：我们的工作为电压成像的最佳时间采样参数的选择提供了指导。 最重要的是，它建议不要在低于500 Hz的帧率下使用扫描电压成像显微镜。 显示英文摘要

摘要： Significance: Voltage imaging microscopy has emerged as a powerful tool to investigate neural activity both in vivo and in vitro. Various imaging approaches have been developed, including point-scanning, line-scanning and wide-field microscopes, however the effects of their different temporal sampling methods on signal fidelity have not yet been fully investigated. Aim: To provide an analysis of the inherent advantages and disadvantages of temporal sampling in scanning and wide-field microscopes and their effect on the fidelity of voltage spike detection. Approach: We develop a mathematical framework based on a mixture of analytical modeling and computer simulations with Monte-Carlo approaches. Results: Scanning microscopes outperform wide-field microscopes in low signal-to-noise conditions and when only a small subset of spikes needs to be detected. Wide-field microscopes outperform scanning microscopes when the measurement is temporally undersampled and a large fraction of the spikes needs to be detected. Both modalities converge in performance as sampling increases and the frame rate reaches the decay rate of the voltage indicator. Conclusions: Our work provides guidance for the selection of optimal temporal sampling parameters for voltage imaging. Most importantly it advises against using scanning voltage imaging microscopes at frame rates below 500 Hz.