标题： 使用开尔文力显微镜确定碳纳米管场效应晶体管的静电杠杆臂 显示英文标题

标题： Determination of the electrostatic lever arm of carbon nanotube field effect transistors using Kelvin Force Microscopy

摘要： 我们使用开尔文探针力显微镜（KFM）在室温下研究具有背栅结构的单壁碳纳米管场效应晶体管器件（CNTFETs）的静电特性。 我们表明，作为器件背栅极化函数记录的KFM图能够全面地确定与KFM探针侧电容相关的平均效应，从而获得具有定量特性的KFM测量结果。 从KFM测量中确定了CNTFET的静电杠杆臂值，并发现其与基于库仑阻塞的输运测量结果一致。 显示英文摘要

摘要： We use Kelvin Force Microscopy (KFM) to study the electrostatic properties of single-walled Carbon Nanotube Field Effect Transistor devices (CNTFETs) with backgate geometry at room temperature. We show that KFM maps recorded as a function of the device backgate polarization enable a complete phenomenological determination of the averaging effects associated with the KFM probe side capacitances, and thus, to obtain KFM measurements with quantitative character. The value of the electrostatic lever arm of the CNTFET is determined from KFM measurements, and found in agreement with transport measurements based on Coulomb blockade.