标题： 使用 MKID 对微波应用的低损耗微带材料进行测试 显示英文标题

标题： Testing low-loss microstrip materials with MKIDs for microwave applications

摘要： 毫米波段未来对天空的测量需要一种低损耗的超导微带线，通常由铌和氮化硅制成，用于将天线耦合到探测器上。 我们提出了一种简单的设备，用于在150 GHz下表征这些低损耗微带线。 在我们的设备中，我们用热源照射天线，并比较通过不同长度微带线传输的150 GHz的测量功率。 功率测量使用直接制造在微带介质上的微波激子电感探测器（MKIDs）进行，并比较测量响应提供了微带线损耗的直接测量值。 我们提出的结构提供了一个简单的设备（4层和DRIE蚀刻），用于表征各种微带材料及其基底的介电损耗。 我们展示了这些设备的初始结果。 我们证明了毫米波段微带线的损耗，长度仅为几十毫米，可以使用实际的铝MKID和数十开尔文的黑体源进行测量。 显示英文摘要

摘要： Future measurements of the millimeter-wavelength sky require a low-loss superconducting microstrip, typically made from niobium and silicon-nitride, coupling the antenna to detectors. We propose a simple device for characterizing these low-loss microstrips at 150 GHz. In our device we illuminate an antenna with a thermal source and compare the measured power at 150 GHz transmitted down microstrips of different lengths. The power measurement is made using Microwave Kinetic Inductance Detectors (MKIDs) fabricated directly onto the microstrip dielectric, and comparing the measured response provides a direct measurement of the microstrip loss. Our proposed structure provides a simple device (4 layers and a DRIE etch) for characterizing the dielectric loss of various microstrip materials and substrates. We present initial results using these devices. We demonstrate that the millimeter wavelength loss of microstrip lines, a few tens of millimeters long, can be measured using a practical aluminum MKID with a black body source at a few tens of Kelvin.