标题： 由10倍测试遗漏引发的静默数据损坏威胁可靠计算 显示英文标题

标题： Silent Data Corruption by 10x Test Escapes Threatens Reliable Computing

摘要： 现有制造测试中逃逸的缺陷计算芯片太多——在数据中心的所有计算芯片类型中，逃逸数量至少比工业目标高一个数量级。 由测试逃逸引起的静默数据损坏（SDCs）如果未得到解决，将对可靠计算构成重大威胁。 我们提出一种三管齐下的方法，概述克服测试逃逸的未来方向：(a) 从系统级错误行为直接诊断缺陷芯片。 这种诊断对于深入了解为何如此多的缺陷芯片逃过现有制造测试至关重要。 (b) 在现场检测缺陷芯片。 (c) 新的测试实验，以了解新检测缺陷芯片技术的有效性。 这些实验必须克服之前工业测试实验和案例研究的缺点和陷阱。 显示英文摘要

摘要： Too many defective compute chips are escaping existing manufacturing tests -- at least an order of magnitude more than industrial targets across all compute chip types in data centers. Silent data corruptions (SDCs) caused by test escapes, when left unaddressed, pose a major threat to reliable computing. We present a three-pronged approach outlining future directions for overcoming test escapes: (a) Quick diagnosis of defective chips directly from system-level incorrect behaviors. Such diagnosis is critical for gaining insights into why so many defective chips escape existing manufacturing testing. (b) In-field detection of defective chips. (c) New test experiments to understand the effectiveness of new techniques for detecting defective chips. These experiments must overcome the drawbacks and pitfalls of previous industrial test experiments and case studies.